Parametric Analyzers Keithley 4200-SCS

Parametric Analyzers Keithley 4200-SCS

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4200-SCS
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Parametric Analyzers  Keithley 4200-SCS

Keithley 4200-SCS

What is a Keithley 4200-SCS Parameter Analyzer?

The 4200-SCS is a modular, fully integrated parameter analyzer that performs electrical characterization of materials, semiconductor devices and processes. From basic I-V and C-V measurement sweeps to advanced ultra-fast pulsed I-V, waveform capture, and transient I-V measurements, the 4200-SCS provides the researcher or engineer with critical parameters needed for design, development or production.

I-V Curves

DC I-V measurements are the cornerstone of device and material testing. The 4200-SCS Source Measure Units (SMU) are precision instruments which are used for sourcing current or voltage and simultaneously measuring capturing current measurements and voltage measurements with high accuracy. The 4200-SCS provides a wide range of I-V measurements including: sub-pA leakage measurements, µΩ resistance measurements.

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