TH2829AX-48 Automatic Transformer Test System 48 pin
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Head Office: Ho Chi Minh City
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Office: Bac Ninh City
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- Add: 184 Binh Than Street, Vo Cuong Ward, Bac Ninh City, Vietnam
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Application
■ Switching transformer scanning test, comprehensive characteristics analysis.
■ Network transformer scanning test, comprehensive characteristics analysis
■ Discrete passive components (L, R, C) multi-channel scanning test
■ Relay drive line package, contact resistance multi-channel scanning test
■ Multi-channel DC resistance DCR scanning test
■ Comprehensive test analysis of multiple passive components in impedance network
Performance characteristics
– Number of test PIN: 48
– Frequency: 20Hz – 200khz, Resolution: 0.5mHz
– Signal level: 5mV-2Vrms (Option: 2mV-10Vrms)
– Test Speed: max. 13ms
– 7-inch TFT LCD display with a resolution of 800xRGBx480
– Built-in-0-100mA/0-10V bias power supply, optional 1A/2A bias current source
– Diode forward and reverse characteristic detection
– Improved high turns ratio and wekly coupled transformer test capability
– Improved DCR testing capabilities
– Single screen can accommodate all scan test results
– Sort the selected scanning parameters
– Time stamping system: memory file setting, calibration deviation and deduction time
– Self-test scanning fixture relays
– Flexible deviation deduction method
– Multiple handling ways for FAIL cases
– Single parameter test cycle to test independent windings
– Incresed security: administrator and opertor passwords
– Built-in statistical analysis capabilities: Cpk, Cp, Ck, etc
– Bar-code reading function can be used to select a setting file or to manage the typr of test products
– Optional PC-level instrument test setup file programming capability
– Online upgrade mode: USB HOST or RS232
– Support multiple instrument networking through LAN interface
– Backward compatible with TH2818X/TH2819X parameter setting file
– Storage: Internal: 100 groups of settings file to save U disk: 500 groups of configuration files, CSV format test data, GIF format images
Accessories
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